Dynamic Centrifugal Acceleration Testing Device Model DAT-1
Now, we can measure the acceleration tests of semiconductors that could not be measured in real time until now.
In the quality control of semiconductor devices, methods such as standalone testing with shock test machines and using vibration test machines have been employed to measure the characteristics of semiconductor devices by applying acceleration under operating conditions. However, these methods have limitations on the applied acceleration and cannot apply continuous high acceleration. The dynamic centrifugal acceleration testing device Model DAT-1 has been developed by applying the technology of centrifugal acceleration testing devices cultivated so far, using high acceleration centrifugal force to apply stress, and measuring dynamic characteristics through wireless communication embedded within the semiconductor device. For more details, please contact us or download the catalog.
- Company：三井電気精機
- Price：Other
